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Chen, Y.*; Asano, Shun*; Wang, T.*; Xie, P.*; Kitayama, Shinnosuke*; Ishii, Kenji*; Matsumura, Daiju; Tsuji, Takuya; Taniguchi, Takanori*; Fujita, Masaki*
JPS Conference Proceedings (Internet), 38, p.011050_1 - 011050_6, 2023/05
Asano, Shun*; Ishii, Kenji*; Matsumura, Daiju; Tsuji, Takuya; Kudo, Kota*; Taniguchi, Takanori*; Saito, Shin*; Sunohara, Toshiki*; Kawamata, Takayuki*; Koike, Yoji*; et al.
Physical Review B, 104(21), p.214504_1 - 214504_7, 2021/12
Times Cited Count:1 Percentile:0(Materials Science, Multidisciplinary)Shamoto, Shinichi
Koon Chodendo No Wakaki Samuraitachi; Nihonjin Kenkyusha No Chosen To Funto No Kiroku, p.105 - 121, 2019/12
no abstracts in English
Asano, Shun*; Ishii, Kenji*; Matsumura, Daiju; Tsuji, Takuya; Ina, Toshiaki*; Suzuki, Kensuke*; Fujita, Masaki*
Journal of the Physical Society of Japan, 87(9), p.094710_1 - 094710_5, 2018/09
Times Cited Count:13 Percentile:64.6(Physics, Multidisciplinary)Asano, Shun*; Suzuki, Kensuke*; Matsumura, Daiju; Ishii, Kenji*; Ina, Toshiaki*; Fujita, Masaki*
Journal of Physics; Conference Series, 969, p.012051_1 - 012051_5, 2018/04
Times Cited Count:3 Percentile:81.88(Physics, Applied)Ishii, Kenji*; Toyama, Takami*; Asano, Shun*; Sato, Kentaro*; Fujita, Masaki*; Wakimoto, Shuichi; Tsutsui, Kenji*; Sota, Shigetoshi*; Miyawaki, Jun*; Niwa, Hideharu*; et al.
Physical Review B, 96(11), p.115148_1 - 115148_8, 2017/09
Times Cited Count:29 Percentile:77.61(Materials Science, Multidisciplinary)Matsuda, Masaaki; Kakurai, Kazuhisa; Yethiraj, M.*; Oka, Kunihiko*
Journal of the Physical Society of Japan, 74(5), p.1578 - 1581, 2005/05
Times Cited Count:3 Percentile:26.63(Physics, Multidisciplinary)no abstracts in English
Matsuda, Masaaki; Kakurai, Kazuhisa; Kurogi, Shogo*; Kudo, Kazutaka*; Koike, Yoji*; Yamaguchi, Hirotaka*; Ito, Toshimitsu*; Oka, Kunihiko*
Physical Review B, 71(10), p.104414_1 - 104414_8, 2005/03
Times Cited Count:13 Percentile:49.91(Materials Science, Multidisciplinary)no abstracts in English
Matsuda, Masaaki; Fujita, Masaki*; Yamada, Kazuyoshi*
Physica C, 408-410, p.810 - 811, 2004/08
Times Cited Count:0 Percentile:0(Physics, Applied)Neutron scattering experiments have been performed in lightly-doped LaCuO in order to study coexistence of a three-dimensional antiferromagnetic (AF) long-range ordered phase and a spin-glass (SG) phase in a very lightly-doped region. Although we studied in a limited range of hole concentration, where Nel temperature is between 270 K and 320 K, no sign of the SG phase was observed, suggesting that there may exist a threshold to realize the phase separation into the AF and SG phases.
Ota, Yukihiro; Machida, Masahiko; Koyama, Tomio*; Matsumoto, Hideki*
no journal, ,
Observing the teraherz radiation emission from BiSrCaCuO leads to a number of the experimental and theoretical studies of revealing the mechanism of the behaviors in superconducting engineering. We develop a large-scale simulation approach for the teraherz emission from intrinsic Josephson junction stacks with multiple spatial scales. We focus on the effects of the number of the junctions in the system, which is considered to be a key ingredient of determining the emission-power bound. Our simulation method successfully predicts the amplification of the emission peaks corresponding to the fundamental mode, i.e., a primary contribution in low-current-biased region.
Ota, Yukihiro; Machida, Masahiko
no journal, ,
Since the observation of teraherz emission from mesas made of layered high-Tc superconductor BiSrCaCuO, the mechanism of radiation attracts a great deal of attention from theoretical and engineering points of view. Emission has a connection with the dynamical aspects of superconducting phases and electromagnetic wave; constructing a theoretical approach to integrating these degrees of freedom is desirable. A way to resolving the issues is built up by 3D dynamical simulations of intrinsic Josephson junction stacks with outside-vacuum contributions. In this article, we apply our code to characterizing teraherz emission in low-bias-current regions. The highlight is to achieve the change of the junction numbers involved the sample. We successfully reproduce the emergence of -kink behaviors. Then, we show the presence of a critical value of the number of junctions for a strong emission.